BEGIN:VCALENDAR
VERSION:2.0
PRODID:-//ctl.byu.edu//NONSGML iCalcreator 2.4.3//EN-US
X-WR-CALNAME;LANGUAGE=en-US:EC EN 451
BEGIN:VEVENT
UID:20120516T204735MDT-4395PwfE6I@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120113
SUMMARY;LANGUAGE=en-US:EC EN 451 : 1.5.3 - 1.5.4\, 3.3\, 3.5 - 3.6\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4406fZStoS@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120130
SUMMARY;LANGUAGE=en-US:EC EN 451 : 2.5\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4414bAnL4L@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120111
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.5.1 - 1.5.2\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4421wFnErw@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120111
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 3.2 is optional: read i
 f you are really interested in the manufacturing process\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4425W59a4B@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120113
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.5.3 - 1.5.4\, 3.3\, 3
 .5 - 3.6\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4431BaUpRT@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120118
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.5.5\, 14.7 (found onl
 ine)\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4438d9ooGA@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120123
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.4.6 - 1.4.8\, 2.5.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4445mM7tO8@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120125
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 14.5\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4450eXVIbT@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120130
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 2.1 - 2.2\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4456GCETPx@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120104
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.1 - 1.2\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4462IP3AeN@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120104
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.3\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4468n7Ftvv@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120104
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.6\, 14.1 - 14.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4475Uig6gV@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120106
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.4 - 1.4.5\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4481DWiVc0@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120201
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 2.5\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4487uN1SGD@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120210
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 15.1 - 15.5\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4492RnT8Ws@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120213
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 4.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4499TDJ7sF@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120215
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 4.5.1\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4505gNnaVt@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120217
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 2.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4512FuseUw@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120217
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 3.4.1\, 3.4.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4521DHhbvk@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120217
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 7.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4528RLzfB5@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120221
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 4.5.2 - 4.5.5\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4535rkt2gN@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120224
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 5.1 - 5.3\, 5.5\, 13.3
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4544U1bKrX@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120227
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 6.1 - 6.3.1\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4549jAWVNr@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120229
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 6.4.1 - 6.4.3\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4556mhPKSb@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120206
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 4.1 - 4.3.6\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4563lwCMCn@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120208
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 8.4.5\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4570XSaHOO@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120316
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 1.10\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4576NhvrLI@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120319
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 10.3.1 - 10.3.7\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-45823Ok3sd@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120302
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 6.3.3 - 6.3.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4588W4Giuv@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120321
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 10.4.2\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4594ljsfiD@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120323
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 10.6\, 13.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4601uNzniM@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120328
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 10.1 - 10.2\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4607m3zhv9@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120330
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 4.6\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4617uPmbJU@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120330
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 14.6\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4623avd1Vu@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120330
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: --\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4630G5kwV2@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120305
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 9.2.1\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4637z5HiIx@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120307
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 9.2.2\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4644wgv4JK@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120307
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 9.2.4\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4650ke8fUN@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120309
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 13.2\, 13.6\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-46589HvPu7@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120402
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 12.1 - 12.4 (but not th
 e sections marked optional in the book ... there is much more information 
 here than we want to cover.)\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4663Xaar0d@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120404
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 13.3\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4673Bzpit6@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120406
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 7.1 - 7.3\, 7.5.2\, 7.6
 \, 12.8\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4678lUz4Tj@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120409
SUMMARY;LANGUAGE=en-US:EC EN 451 Assigned readings: 15.6 - 15.7\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4685Hwjnx8@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120111
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW#1 - static CMOS\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4691RZONcC@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120116
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: No class
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4697eSJsmr@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120118
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #2 - static CMOS and desig
 n rules\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4703cLWXsM@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120120
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: Lab 1 - schematic capture\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-47107bTCGn@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120125
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #3 - stick diagrams and si
 zing\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-47179FASrH@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120127
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments:  Lab 2 - layout\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4723nNpo2m@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120201
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #4 - Pass transistors and 
 economics\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4729lZ8muM@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120215
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments:  HW #6 - RC delay\, character
 ization\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-47368ue3tZ@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120217
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: Lab 3 - characterization\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4741RbuRlc@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120220
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: No class
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4747XiDbcR@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120222
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments:  HW #7 - Logical effort\, sca
 ling\, model limits\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4753UEtZvE@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120229
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #8 - Logical effort\, powe
 r\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4762hd4UuJ@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120206
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: Midterm 1 opens\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4768iv2Vg4@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120208
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #5 - DC transfer\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4775GXzPEr@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120208
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: Midterm 1 closes\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4781xlf4u5@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120314
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #10 - CMOS variants\, pseu
 do-NMOS\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4787PSax2l@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120319
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: Midterm 2 opens\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-47947legFb@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120321
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #11 - Dynamic logic\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4800uGdkkC@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120321
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: Midterm 2 closes\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4806c9XVNv@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120328
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #12 - sequential elements
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4812cioflG@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120330
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: Lab 4 - sequential element de
 sign and characterization\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-48177d6PGV@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120307
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #9 - Wires\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4824l2vWlU@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120411
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: Lab 5 - chip assembly\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4830SasNZ4@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120412
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: No class
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4836BjiKcH@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120413
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: No class
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-48414Nuuzh@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120404
SUMMARY;LANGUAGE=en-US:EC EN 451 Assignments: HW #13 - sequential timing\, 
 timing analysis\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4847uUNjPi@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120111
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Fabrication\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4859uivAwR@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120112
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Cadence setup and schematic editor
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4865hbW1Gj@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120113
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Layout design rules\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-48755D4bUj@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120116
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Martin Luther King Jr. Holiday
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-48827AaWeU@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120118
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Stick diagrams and size estimation
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4888jVb582@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120119
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Cadence layout tools\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4895GfKfCc@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120120
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Stick diagrams\, cont.\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-49013URHpN@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120123
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Voltage model and pass transistors
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4908rmrpcV@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120125
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Pass transistors\, cont.\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4913ITCdjc@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120125
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Design economics\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4920BDcNak@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120126
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Open lab\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-49257IUVpi@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120127
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Design Economics\, cont.\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4931Tv70G4@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120130
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: CMOS device characteristics\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4938WJcKRR@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120104
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Course introduction\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4943ZFmeTm@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120104
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: MOS transistors\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4950uvV8FS@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120104
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Design flows\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4956oB4RhX@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120105
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: No class\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-49624OUbVg@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120106
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Static CMOS gates\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-49679IKHUW@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120109
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Static CMOS gates\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4974HxAunz@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120201
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: DC transfer\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4980UP4gUD@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120210
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Verification and test\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4986xmM0ur@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120213
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Logical effort: motivation and der
 ivation\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4992EG8bX0@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120215
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Logical effort: size optimization
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-4998cvUxwi@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120216
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Open lab\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5003ejodSF@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120217
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Transistor model limits\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5008zZo7hl@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120217
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: New transistor technologies\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5013GcuLBC@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120217
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Scaling\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-501888s0Pe@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120202
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Midterm review\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5024LM4aRK@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120220
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Presidents Day Holiday
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-503041HBCJ@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120221
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Logical effort: path optimization
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5035bPPv38@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120222
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Logical effort: problems\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5040euVJDb@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120223
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Q & A\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-50469HHutM@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120224
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Power\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-50526xuxIR@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120227
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Wire delays\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5058FDEMD0@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120229
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Wire engineering\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5064UPeSbf@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120203
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: DC transfer\, continued\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5069NRC38J@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120206
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: RC delay models\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5074Pthj6r@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120208
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Characterization\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-50794ZhiFW@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120208
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: RC delay models\, continued\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5084IWflU9@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120209
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Cadence simulation tools\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-508998HPvR@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120301
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Q & A\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-50947aT9x5@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120312
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Dynamic CMOS\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5102xojLue@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120314
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Dynamic CMOS\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5108v8B7Zg@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120315
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Midterm review\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5115Dln9v3@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120316
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Floorplanning\, Place and Route\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5122mhGFkL@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120319
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Sequential element design\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5130iuwkuN@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120302
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Noise\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5135Uv2oV3@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120321
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Sequential element characterizatio
 n\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5140MJthgt@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120322
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Simulation for sequential element 
 characterization\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5145mIF8rh@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120323
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Metastability\; Clock distribution
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5151f7ubGF@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120326
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Clock distribution\, cont.\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5157VuBgax@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120328
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Sequential timing methodology\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5162S3FimA@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120329
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Open Lab\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5169h7uU1J@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120330
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Sequential timing\, cont.\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5175xantPW@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120330
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Timing analysis and closure\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5181jzwHGD@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120330
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Documentation\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-51882ZIeOc@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120305
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Static CMOS variants\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5194WANXRJ@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120307
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Pseudo-NMOS\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5200rjJbGu@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120307
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Dynamic CMOS\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-520699Nj26@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120308
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Open Lab\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5213aBSu6P@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120309
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: I/O and packaging\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-52205ITuOu@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120411
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Review\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5227nKMDgG@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120412
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Exam Preparation Day
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-52337zBg5w@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120413
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Exam Preparation Day
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5240vdTfaa@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120414
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Final exam opens in testing center
 \n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5245v8BKXB@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120418
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Final exam closes in testing cente
 r\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5252s58fvW@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120402
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Array design and memory cells\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5258gBSWVP@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120404
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Power distribution\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5264tLwp78@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120405
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Cadence router\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5272HMK6lh@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120406
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: Reliability\n
END:VEVENT
BEGIN:VEVENT
UID:20120516T204735MDT-5278vN27VR@ctl.byu.edu
DTSTAMP:20120516T024735Z
DTSTART;VALUE=DATE:20120409
SUMMARY;LANGUAGE=en-US:EC EN 451 Topics: DFT & Test\n
END:VEVENT
END:VCALENDAR